Control system professionals get these questions all the time. They appear on bulletin boards, in newsgroups, and on control-related mailing lists. They come on the phone and in the mail. The question usually starts, "How do I..." Nearly, every one of them deals with a difficult-to-impossible application.
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A recently published article addressed the K factor of a particular class of flowmeters in liquid service by stating that, "Should the flow profile of a pipeline transition from turbulent (high velocities) to a laminar flow regime (low profile), flow measurement technologies may experience a change in K factor that can result in low resolution."
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In addition to over 35 years of experience as an instrument user, consultant, and expert witness, David W Spitzer has written over 10 books and 250 articles about flow measurement, level measurement, instrumentation, and process control. David (with Walt Boyes) is the author of seven Consumer Guides to various industrial flow and level technologies. David teaches his flow measurement seminars in both English and Portuguese.
Spitzer and Boyes, LLC provides engineering, technical writing, training seminars, strategic marketing consulting, distribution consulting, and expert witness services worldwide, and can be contacted at +1.845.623.1830 or www.spitzerandboyes.com.
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